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Defects and Impurities in Silicon Materials

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Defects and Impurities in Silicon Materials Synopsis

This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. 


The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.

About This Edition

ISBN: 9784431557999
Publication date: 31st March 2016
Author: Yutaka Yoshida, Guido Langouche
Publisher: Springer an imprint of Springer Japan
Format: Paperback
Pagination: 487 pages
Series: Lecture Notes in Physics
Genres: Electronic devices and materials
Condensed matter physics (liquid state and solid state physics)
Nanotechnology
Materials science
Electronics engineering
Nanosciences