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Applied Scanning Probe Methods XIII

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Applied Scanning Probe Methods XIII Synopsis

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

About This Edition

ISBN: 9783642098727
Publication date: 19th November 2010
Author: Bharat Bhushan, Harald Fuchs
Publisher: Springer an imprint of Springer Berlin Heidelberg
Format: Paperback
Pagination: 238 pages
Series: NanoScience and Technology
Genres: Electronics engineering
Engineering applications of polymers and composites
Condensed matter physics (liquid state and solid state physics)
Spectrum analysis, spectrochemistry, mass spectrometry
Nanotechnology
Materials science