The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.
| ISBN: | 9783540643715 |
| Publication date: | 21st May 2003 |
| Author: | R KrauseRehberg, H S Leipner |
| Publisher: | Springer an imprint of Springer Berlin Heidelberg |
| Format: | Hardback |
| Pagination: | 378 pages |
| Series: | Springer Series in Solid-State Sciences |
| Genres: |
Condensed matter physics (liquid state and solid state physics) Spectrum analysis, spectrochemistry, mass spectrometry Engineering applications of electronic, magnetic, optical materials Testing of materials |