X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and applied to the atomic structure analysis of silicate glasses thin layers; XPS as a tool in the study of nanostructured titanium and in commercial PET surfaces in biotechnological applications and others.
| ISBN: | 9781616689155 |
| Publication date: | 26th August 2011 |
| Author: | Johanna M Wagner |
| Publisher: | Nova Science Publishers an imprint of Nova Science Publishers Inc |
| Format: | Hardback |
| Pagination: | 277 pages |
| Series: | Chemical Engineering Methods and Technology |
| Genres: |
Industrial chemistry and chemical engineering |