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Defects in SiO2 and Related Dielectrics

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Defects in SiO2 and Related Dielectrics Synopsis

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

About This Edition

ISBN: 9780792366867
Publication date:
Author: Gianfranco Pacchioni, Linards Skuja, David L Griscom
Publisher: Springer an imprint of Springer Netherlands
Format: Paperback
Pagination: 624 pages
Series: NATO Science Series II: Mathematics, Physics and Chemistry
Genres: Testing of materials
Condensed matter physics (liquid state and solid state physics)