Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)

Like the first edition its aim continues to be for final year undergraduates, first year PhD students, and anyone who may be starting out using secondary ion mass spectrometry as part of their research, with the purpose of giving a clear description of the science that underpins SIMS along with comprehensible description of the main components that make up a modern SIMS instrument, and the many variations that have been developed over recent years. There is a clear description of the types of analyses that may be carried out in a SIMS experiment; mass spectrometry, ion mapping, depth profiling, and 3D analyses, and explanations on how to define high quality data (image resolution etc.). In the final section, an updated collection of applications are presented. Several different material groups are considered, including nanoparticle characterisation and different approaches to sample preparation.