The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
| ISBN: | 9780471848936 |
| Publication date: | 7th June 1989 |
| Author: | T P Ma, Paul V Dressendorfer |
| Publisher: | Wiley-Interscience an imprint of Wiley |
| Format: | Hardback |
| Pagination: | 587 pages |
| Genres: |
Electronics and communications engineering |