Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.
ISBN: | 9780387946184 |
Publication date: | 4th April 1996 |
Author: | Luc Devroye, László Györfi, Gábor Lugosi |
Publisher: | Springer an imprint of Springer New York |
Format: | Hardback |
Pagination: | 636 pages |
Series: | Stochastic Modelling and Applied Probability |
Genres: |
Probability and statistics Stochastics Pattern recognition |