TSV 3D RF Integration: High Resistivity Si Interposer Technology systematically introduces the design, process development and application verification of high-resistivity silicon interpose technology, addressing issues of high frequency loss and high integration level. The book includes a detailed demonstration of the design and process development of Hr-Si interposer technology, gives case studies, and presents a systematic literature review. Users will find this to be a resource with detailed demonstrations of the design and process development of HR-Si interposer technologies, including quality monitoring and methods to extract S parameters. A series of cases are presented, including an example of an integrated inductor, a microstrip inter-digital filter, and a stacked patch antenna. Each chapter includes a systematic and comparative review of the research literature, offering researchers and engineers in microelectronics a uniquely useful handbook to help solve problems in 3D heterogenous RF integration oriented Hr-Si interposer technology.
ISBN: | 9780323996020 |
Publication date: | 27th April 2022 |
Author: | Shenglin Associate Professor, Department of Mechanical and Electrical Engineering, Xiamen University, China Ma, Yufeng Jin |
Publisher: | Elsevier - Health Sciences Division |
Format: | Paperback |
Pagination: | 292 pages |
Genres: |
Materials science |