Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.
ISBN: | 9783540433125 |
Publication date: | 19th July 2002 |
Author: | International Workshop on Nanoscale Spectroscopy and its Applications to Semiconductor Research, Yoshio Watanabe |
Publisher: | Springer an imprint of Springer Berlin Heidelberg |
Format: | Hardback |
Pagination: | 306 pages |
Series: | Lecture Notes in Physics |